Gnomit / Keyword Search / Info
Gnomit ? ? ?
Results 1 - 1 of 1 for:
interference
1
thin film characterisation
1 ?
 21,213,375 websites (safe search)

  1. DIGILEM - Interferometric Endpoint Detector & Thin Film Monitor

    Interferometry is a powerful technique that can be used for endpoint detection of planar layer and trench etching, or deposition
    plasma2
    semiconductor2
    semiconductors2
    deposition2
    etch1
    interference1
    Sofie1
    endpoint1
    interferometry1
    film thickness1
    interferometers1
    plasma etch1
    end point1
    dry etching1
    thickness monitors1
    dry etch1
    thin film characterisation1
    end point detection1
    endpoint detection1
    thin film measurements1
    deposition rate1
    end point detectors1
    endpointer1
    end pointer1
    end point systems1
    endpoint systems1
    etch rate1
    thin film monitors1
    Digilem0
    etching control0
    semiconductor characterisation0

    www.digilem.com - 2009-02-08

emi2 electromagnetic1 compliance3 polymer2 paint3 music7 ibm3 kappa1 polymeric characterisation1 polarized light1 magnetic2 film thickness1 rfi1 psi2 emc2 alpha2 glossmeter1 paint testing1 energy4 fraternity2

About Gnomit
Keywords may contain spaces.
Separate multiple keywords with commas.
Start a new search.
Enter new keyword(s).
Narrow down your search.
Add keyword(s).
Broaden your search.
Click on Keyword to remove from query.